Indian Journal of Pure & Applied Physics (IJPAP)
28-Apr-2024 12:41:44 IST
Journal Help
http://op.niscair.res.in/index.php/IJCT/article/view/2944/465464960
http://op.niscair.res.in/index.php/IJCT/article/view/4869/465464963
http://op.niscair.res.in/index.php/IJCT/article/view/3821/465464961
User
Username
Password
Remember me
Notifications
View
Subscribe
/
Unsubscribe
Journal Content
Search
All
Authors
Title
Abstract
Index terms
Full Text
Browse
By Issue
By Author
By Title
Other Journals
Font Size
Information
For Readers
For Authors
For Librarians
http://op.niscair.res.in/index.php/IJCT/article/view/2944/465464960
http://op.niscair.res.in/index.php/IJCT/article/view/4869/465464963
http://op.niscair.res.in/index.php/IJCT/article/view/3821/465464961
OP-HOME
IJPAP-Home
About
Log In
Search
Current
Archives
Announcements
NIScPR
NOPR
Home
>
Search
>
Author Details
Author Details
Sinha, A K
Vol 58, No 5 (2020): Indian Journal of Pure & Applied Physics
- Articles
Quasi-elastic scattering measurements of the
28
Si +
142
Nd system at back-angle
Abstract
PDF
Indian Journal of Pure & Applied Physics (IJPAP)