Indian Journal of Pure & Applied Physics (IJPAP)
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http://op.niscair.res.in/index.php/IJCT/article/view/2944/465464960
http://op.niscair.res.in/index.php/IJCT/article/view/4869/465464963
http://op.niscair.res.in/index.php/IJCT/article/view/3821/465464961
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Author Details
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Biswas, Rohan
Vol 58, No 5 (2020): Indian Journal of Pure & Applied Physics
- Articles
Quasi-elastic scattering measurements of the
28
Si +
142
Nd system at back-angle
Abstract
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Indian Journal of Pure & Applied Physics (IJPAP)