Journal of Scientific & Industrial Research

Bonam, Janakiramaiah, Prasad V Potluri Siddhartha Institute of Technology, Vijayawada, 520 007, Andhra Pradesh, India, India

• Vol 82, No 04 (2023) - Computer Science & Information Technology
  

  Lightweight CNN Models for Product Defect Detection with Edge Computing in Manufacturing Industries

  
  Abstract  PDF